Power Distribution Networks With On-chip Decoupling Capacitors
by Popovich, Mikhail; Mezhiba, Andrey; Friedman, Eby G.Rent Textbook
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Summary
Table of Contents
| Introduction | p. 1 |
| Evolution of integrated circuit technology | p. 3 |
| Evolution of design objectives | p. 7 |
| The problem of power distribution | p. 10 |
| Deleterious effects of power distribution noise | p. 17 |
| Signal delay uncertainty | p. 17 |
| On-chip clock jitter | p. 17 |
| Noise margin degradation | p. 20 |
| Degradation of gate oxide reliability | p. 20 |
| Book outline | p. 20 |
| Inductive Properties of Electric Circuits | p. 27 |
| Definitions of inductance | p. 28 |
| Field energy definition | p. 28 |
| Magnetic flux definition | p. 30 |
| Partial inductance | p. 35 |
| Net inductance | p. 40 |
| Variation of inductance with frequency | p. 43 |
| Uniform current density approximation | p. 44 |
| Inductance variation mechanisms | p. 45 |
| Simple circuit model | p. 49 |
| Inductive behavior of circuits | p. 52 |
| Inductive properties of on-chip interconnect | p. 54 |
| Summary | p. 58 |
| Properties of On-Chip Inductive Current Loops | p. 59 |
| Introduction | p. 59 |
| Dependence of inductance on line length | p. 60 |
| Inductive coupling between two parallel loop segments | p. 67 |
| Application to circuit analysis | p. 68 |
| Summary | p. 69 |
| Electromigration | p. 71 |
| Physical mechanism of electromigration | p. 72 |
| Electromigration-induced mechanical stress | p. 75 |
| Steady state limit of electromigration damage | p. 76 |
| Dependence of electromigration lifetime on the line dimensions | p. 78 |
| Statistical distribution of electromigration lifetime | p. 81 |
| Electromigration lifetime under AC current | p. 82 |
| Electromigration in novel interconnect technologies | p. 83 |
| Designing for electromigration reliability | p. 85 |
| Summary | p. 86 |
| High Performance Power Distribution Systems | p. 87 |
| Physical structure of a power distribution system | p. 88 |
| Circuit model of a power distribution system | p. 89 |
| Output impedance of a power distribution system | p. 92 |
| A power distribution system with a decoupling capacitor | p. 95 |
| Impedance characteristics | p. 95 |
| Limitations of a single-tier decoupling scheme | p. 99 |
| Hierarchical placement of decoupling capacitance | p. 101 |
| Resonance in power distribution networks | p. 108 |
| Full impedance compensation | p. 114 |
| Case study | p. 116 |
| Design considerations | p. 119 |
| Inductance of the decoupling capacitors | p. 119 |
| Interconnect inductance | p. 120 |
| Limitations of the one-dimensional circuit model | p. 121 |
| Summary | p. 124 |
| Decoupling Capacitance | p. 125 |
| Introduction to decoupling capacitance | p. 126 |
| Historical retrospective | p. 126 |
| Decoupling capacitor as a reservoir of charge | p. 127 |
| Practical model of a decoupling capacitor | p. 129 |
| Impedance of power distribution system with decoupling capacitors | p. 133 |
| Target impedance of a power distribution system | p. 133 |
| Antiresonance | p. 136 |
| Hydraulic analogy of hierarchical placement of decoupling capacitors | p. 140 |
| Intrinsic vs intentional on-chip decoupling capacitance | p. 145 |
| Intrinsic decoupling capacitance | p. 146 |
| Intentional decoupling capacitance | p. 150 |
| Types of on-chip decoupling capacitors | p. 152 |
| Polysilicon-insulator-polysilicon (PIP) capacitors | p. 153 |
| MOB capacitors | p. 155 |
| Metal-insulator-metal (MIM) capacitors | p. 163 |
| Lateral flux capacitors | p. 165 |
| Comparison of on-chip decoupling capacitors | p. 169 |
| On-chip switching voltage regulator | p. 171 |
| Summary | p. 173 |
| On-Chip Power Distribution Networks | p. 175 |
| Styles of on-chip power distribution networks | p. 176 |
| Basic structure of on-chip power distribution networks | p. 176 |
| Improving the impedance characteristics of on-chip power distribution networks | p. 181 |
| Evolution of power distribution networks in Alpha microprocessors | p. 182 |
| Die-package interface | p. 184 |
| Other considerations | p. 189 |
| Summary | p. 191 |
| Computer-Aided Design and Analysis | p. 193 |
| Design flow for on-chip power distribution networks | p. 194 |
| Linear analysis of power distribution networks | p. 199 |
| Modeling power distribution networks | p. 201 |
| Characterizing the power current requirements of on-chip circuits | p. 207 |
| Numerical methods for analyzing power distribution networks | p. 210 |
| Allocation of on-chip decoupling capacitors | p. 217 |
| Charge-based allocation methodology | p. 218 |
| Allocation strategy based on the excessive noise amplitude | p. 220 |
| Allocation strategy based on excessive charge | p. 221 |
| Summary | p. 223 |
| Inductive Properties of On-Chip Power Distribution Grids | p. 225 |
| Power transmission circuit | p. 225 |
| Simulation setup | p. 228 |
| Grid types | p. 228 |
| Inductance versus line width | p. 233 |
| Dependence of inductance on grid type | p. 234 |
| Non-interdigitated versus interdigitated grids | p. 234 |
| Paired versus interdigitated grids | p. 235 |
| Dependence of Inductance on grid dimensions | p. 236 |
| Dependence of inductance on grid width | p. 236 |
| Dependence of inductance on grid length | p. 238 |
| Sheet inductance of power grids | p. 238 |
| Efficient computation of grid inductance | p. 239 |
| Summary | p. 241 |
| Variation of Grid Inductance with Frequency | p. 243 |
| Analysis approach | p. 243 |
| Discussion of inductance variation | p. 245 |
| Circuit models | p. 245 |
| Analysis of inductance variation | p. 248 |
| Summary | p. 250 |
| Inductance/Area/Resistance Tradeoffs | p. 253 |
| Inductance vs. resistance tradeoff under a constant grid area constraint | p. 253 |
| Inductance vs. area tradeoff under a constant grid resistance constraint | p. 258 |
| Summary | p. 260 |
| Scaling Trends of On-Chip Power Distribution Noise | p. 263 |
| Prior work | p. 264 |
| Interconnect characteristics | p. 266 |
| Global interconnect characteristics | p. 268 |
| Scaling of the grid inductance | p. 268 |
| Flip-chip packaging characteristics | p. 269 |
| Impact of on-chip capacitance | p. 271 |
| Model of power supply noise | p. 272 |
| Power supply noise scaling | p. 274 |
| Analysis of constant metal thickness scenario | p. 274 |
| Analysis of the scaled metal thickness scenario | p. 275 |
| ITRS scaling of power noise | p. 277 |
| Implications of noise scaling | p. 281 |
| Summary | p. 282 |
| Impedance Characteristics of Multi-Layer Grids | p. 285 |
| Electrical properties of multi-layer grids | p. 287 |
| Impedance characteristics of individual grid layers | p. 287 |
| Impedance characteristics of multi-layer grids | p. 290 |
| Case study of a two layer grid | p. 292 |
| Simulation setup | p. 293 |
| Inductive coupling between grid layers | p. 293 |
| Inductive characteristics of a two layer grid | p. 297 |
| Resistive characteristics of a two layer grid | p. 298 |
| Variation of impedance with frequency in a two layer grid | p. 300 |
| Design implications | p. 301 |
| Summary | p. 302 |
| Multiple On-Chip Power Supply Systems | p. 305 |
| ICs with multiple power supply voltages | p. 306 |
| Multiple power supply voltage techniques | p. 307 |
| Clustered voltage scaling (CVS) | p. 309 |
| Extended clustered voltage scaling (ECVS) | p. 310 |
| Challenges in ICs with multiple power supply voltages | p. 311 |
| Die area | p. 312 |
| Power dissipation | p. 312 |
| Design complexity | p. 313 |
| Placement and routing | p. 313 |
| Optimum number and magnitude of available power supply voltages | p. 316 |
| Summary | p. 321 |
| On-Chip Power Distribution Grids with Multiple Supply Voltages | p. 323 |
| Background | p. 325 |
| Simulation setup | p. 325 |
| Power distribution grid with dual supply and dual ground | p. 328 |
| Interdigitated grids with DSDG | p. 331 |
| Type I interdigitated grids with DSDG | p. 331 |
| Type II interdigitated grids with DSDG | p. 333 |
| Paired grids with DSDG | p. 335 |
| Type I paired grids with DSDG | p. 336 |
| Type II paired grids with DSDG | p. 337 |
| Simulation results | p. 340 |
| Interdigitated power distribution grids without decoupling capacitors | p. 341 |
| Paired power distribution grids without decoupling capacitors | p. 348 |
| Power distribution grids with decoupling capacitors | p. 349 |
| Dependence of power noise on the switching frequency of the current loads | p. 353 |
| Design implications | p. 356 |
| Summary | p. 358 |
| Decoupling Capacitors for Multi-Voltage Power Distribution Systems | p. 361 |
| Impedance of a power distribution system | p. 363 |
| Impedance of a power distribution system | p. 364 |
| Antiresonance of parallel capacitors | p. 367 |
| Dependence of impedance on power distribution system parameters | p. 368 |
| Case study of the impedance of a power distribution system | p. 371 |
| Voltage transfer function of power distribution system | p. 376 |
| Voltage transfer function of a power distribution system | p. 376 |
| Dependence of voltage transfer function on power distribution system parameters | p. 378 |
| Case study of the voltage response of a power distribution system | p. 381 |
| Overshoot-free magnitude of a voltage transfer function | p. 383 |
| Tradeoff between the magnitude and frequency range | p. 385 |
| Summary | p. 389 |
| On-chip Power Noise Reduction Techniques in High Performance ICs | p. 391 |
| Ground noise reduction through an additional low noise on-chip ground | p. 393 |
| Dependence of ground bounce reduction on system parameters | p. 395 |
| Physical separation between noisy and noise sensitive circuits | p. 396 |
| Frequency and capacitance variations | p. 397 |
| Impedance of an additional ground path | p. 399 |
| Summary | p. 400 |
| Effective Radii of On-Chip Decoupling Capacitors | p. 403 |
| Background | p. 405 |
| Effective radius of on-chip decoupling capacitor based on a target impedance | p. 407 |
| Estimation of required on-chip decoupling capacitance | p. 409 |
| Dominant resistive noise | p. 410 |
| Dominant inductive noise | p. 411 |
| Critical line length | p. 414 |
| Effective radius as determined by charge time | p. 416 |
| Design methodology for placing on-chip decoupling capacitors | p. 422 |
| Model of on-chip power distribution network | p. 422 |
| Case study | p. 425 |
| Design implications | p. 431 |
| Summary | p. 432 |
| Efficient Placement of Distributed On-Chip Decoupling Capacitors | p. 435 |
| Technology constraints | p. 436 |
| Placing on-chip decoupling capacitors in nanoscale ICs | p. 437 |
| Design of a distributed on-chip decoupling capacitor network | p. 440 |
| Design tradeoffs in a distributed on-chip decoupling capacitor network | p. 445 |
| Dependence of system parameters on R[subscript 1] | p. 446 |
| Minimum C[subscript 1] | p. 447 |
| Minimum total budgeted on-chip decoupling capacitance | p. 448 |
| Design methodology for a system of distributed on-chip decoupling capacitors | p. 450 |
| Case study | p. 453 |
| Summary | p. 457 |
| Impedance/Noise Issues in On-Chip, Power Distribution Networks | p. 459 |
| Scaling effects in chip-package resonance | p. 460 |
| Propagation of power distribution noise | p. 463 |
| Local inductive behavior | p. 465 |
| Summary | p. 469 |
| Conclusions | p. 471 |
| Appendices | |
| Mutual Loop Inductance in Fully Interdigitated Power Distribution Grids with DSDG | p. 477 |
| Mutual Loop Inductance in Pseudo-Interdigitated Power Distribution Grids with DSDG | p. 479 |
| Mutual Loop Inductance in Fully Paired Power Distribution Grids with DSDG | p. 481 |
| Mutual Loop Inductance in Pseudo-Paired Power Distribution Grids with DSDG | p. 483 |
| References | p. 485 |
| Index | p. 509 |
| Table of Contents provided by Ingram. All Rights Reserved. |
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