Fourier Transform Infrared Spectrometry

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Edition: 2nd
Format: Hardcover
Pub. Date: 2007-05-08
Publisher(s): Wiley-Interscience
List Price: $188.74

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Summary

A bestselling classic reference, now expanded and updated to cover the latest instrumentation, methods, and applications The Second Edition of Fourier Transform Infrared Spectrometry brings this core reference up to date on the uses of FT-IR spectrometers today. The book starts with an in-depth description of the theory and current instrumentation of FT-IR spectrometry, with full chapters devoted to signal-to-noise ratio and photometric accuracy. Many diverse types of sampling techniques and data processing routines, most of which can be performed on even the less expensive instruments, are then described. Extensively updated, the Second Edition: Discusses improvements in optical components Features a full chapter on FT Raman Spectrometry Contains new chapters that focus on different ways of measuring spectra by FT-IR spectrometry, including fourteen chapters on such techniques as microspectroscopy, internal and external reflection, and emission and photoacoustic spectrometry Includes a new chapter introducing the theory of vibrational spectrometry Organizes material according to sampling techniques Designed to help practitioners using FT-IR capitalize on the plethora of techniques for modern FT-IR spectrometry and plan their experimental procedures correctly, this is a practical, hands-on reference for chemists and analysts. It's also a great resource for students who need to understand the theory, instrumentation, and applications of FT-IR.

Author Biography

Peter R. Griffiths, PhD, is a Professor of Chemistry at the University of Idaho. He has published over 250 papers on various aspects of vibrational spectroscopy; most of his research is oriented towards solving problems by infrared and Raman spectroscopy. He has also edited eight books on this subject. He teaches several courses on aspects of infrared spectroscopy with Dr. de Haseth, and is the director of the workshops that are held every summer at Bowdoin College. He has won numerous awards including the SSP Award and the Bomem-Michelson Award.

James A. de Haseth, PhD, is a Professor of Chemistry at the University of Georgia. He has worked with FT-IR spectrometers for over thirty years and has published and lectured extensively on their operation and performance.

Table of Contents

The Michelson Interferometer
Sampling the Interferogram
Computing Techniques
Two-Beam Interferometers
Auxiliary Optics for FT-IR Spectrometry
Data Systems
Signal-to-Noise Ratio
Reduction of Dynamic Range in FT-IR Spectrometry
Photothermal Fourier Spectrometry
Quantitative Analysis
Dispersive Fourier Transform Spectrometry
FT-IR Spectrometry of Time-Dependent Phenomena
FT-IR Studies of Polymers
Biochemical and Biomedical Applications
Low Temperature Studies
Atomic Emission Spectrometry
Surface Analysis
GC/FT-IR Spectrometry
The HPLC/FT-IR Interface
Index
Table of Contents provided by Publisher. All Rights Reserved.

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