Electronic Test Instruments Analog and Digital Measurements

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Edition: 2nd
Format: Paperback
Pub. Date: 2002-03-21
Publisher(s): Pearson
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Summary

For every electronics professional, Electronic Test Instruments: Analog and Digital Measurements offers a thorough survey of the field of electronics Instrumentation: devices and techniques, digital and analog. Witte introduces basic measurement theory, along with commonly used electronic test equipment -- including meters, signal sources, oscilloscopes, frequency counters, power supplies, spectrum analyzers, network analyzers and logic analyzers. He presents detailed examples of applying each type of equipment in real-world applications, emphasizing basic functionality and guidance on choosing the instrument most likely to obtain a valid measurement. He offers a unified treatment of both analog and digital devices, explaining their commonalities and differences, while presenting up-to-the-minute coverage of the measurement techniques required by today's advanced digital systems.

Author Biography

Robert A. Witte is an Engineering Manager with Agilent Technologies (formerly Hewlett-Packard), where he is responsible for the design and development of electronic test and measurement equipment. He has taught electrical engineering courses as an adjunct professor at two universities and has written two books and numerous magazine articles about test and measurement instrumentation.

Table of Contents

Preface xv
Acknowledgments xvi
Measurement Theory
1(52)
Electrical Quantities
1(3)
Resistance
4(1)
Polarity
5(1)
Direct Current
6(1)
Power
6(1)
Alternating Current
7(1)
RMS Value
8(1)
Average Value
9(1)
Crest Factor
10(1)
Phase
11(2)
AC Power
13(1)
Nonsinusoidal Waveforms
14(1)
Harmonics
15(1)
Square Wave
16(3)
Pulse Train
19(3)
Combined DC and AC
22(2)
Modulated Signals
24(5)
Amplitude Modulation
24(2)
Frequency Modulation
26(1)
Modulated Signals in the Frequency Domain
26(3)
Decibels
29(1)
Absolute Decibel Values
30(6)
dBm
31(1)
dBV
31(5)
Other References
36(1)
Measurement Error
36(1)
Internal Error
37(1)
The Loading Effect
37(1)
The Voltage Divider
38(1)
Maximum Voltage Transfer
39(1)
Maximum Power Transfer
40(1)
Impedance
41(1)
Instrument Inputs
42(2)
High-Impedance Inputs
42(1)
System-Impedance Inputs
42(1)
Connectors
43(1)
Bandwidth
44(2)
Rise Time
46(1)
Bandwidth Limitation on Square Wave
46(2)
Digital Signals
48(2)
Logic Families
50(1)
References
51(2)
Voltmeters, Ammeters, and Ohmmeters
53(26)
Meters
53(2)
Analog Meters
53(1)
Digital Meters
54(1)
DC Voltmeters
55(2)
AC Voltmeters
57(4)
Average-Responding Meter
58(1)
Peak-Reading Meters
58(1)
True-RMS Meters
58(1)
Bandwidth
59(1)
AC and DC Coupling
59(2)
RF Probes
61(1)
Ammeters
62(2)
Ammeter Used as a Voltmeter
64(1)
Voltmeter Used as an Ammeter
64(1)
Current-Sense Resistor
65(2)
Current Shunt
66(1)
AC Ammeter
67(1)
Ohmmeters
67(1)
Voltmeter-Ammeter Method
68(1)
Series Ohmmeter
69(1)
Current-Source Method
70(1)
4-Wire Ohms Measurements
70(2)
Multimeters
72(1)
Meter Range
73(1)
Autorange
73(1)
Other Multimeter Functions
74(1)
Continuity Indicator
74(1)
Diode Test
74(1)
Frequency Counter
74(1)
Minimum, Maximum, Average Readout
74(1)
Capacitance Measurement
75(1)
Temperature Measurement
75(1)
Specifications
75(2)
References
77(2)
Signal Sources
79(26)
Circuit Model
79(1)
Floating and Grounded Outputs
80(1)
Sine Wave Sources
81(2)
Imperfections in Sine Wave Sources
83(3)
Frequency Accuracy
85(1)
Frequency Stability
85(1)
Amplitude Accuracy
85(1)
Distortion
86(1)
Spurious Responses
86(1)
Close-in Sidebands
86(1)
Function Generators
86(11)
Arbitrary Waveform Generators
89(3)
Arbitrary Waveforms
92(1)
Modulation (AM, FM)
93(1)
Burst
93(1)
Frequency Shift Keying
94(1)
Frequency Sweep
95(1)
Sync Output
96(1)
Phase Locking
96(1)
Pulse Generators
97(2)
RF Signal Generators
99(3)
Summary of Signal Sources
102(1)
References
103(2)
Oscilloscopes
105(52)
The Oscilloscope Concept
105(2)
Analog Scope Block Diagram
107(1)
Digital Scope Block Diagram
108(2)
Sample Rate
110(2)
Aliasing
111(1)
Sample Rate Specification
111(1)
Real-Time Sampling
112(2)
Repetitive Sampling
114(3)
Effective Sample Rate
116(1)
Memory Depth
116(1)
Triggering
117(8)
Edge Trigger
119(1)
Trigger Source
119(1)
Trigger Holdoff
120(1)
Video Trigger
121(1)
Pulse-Width Trigger
121(1)
Pattern Trigger
122(1)
State Trigger
123(1)
Transition Time Trigger
124(1)
Setup and Hold Trigger
124(1)
Acquisition/Sweep Control
125(3)
Automatic and Normal Acquisition
125(1)
Chop and Alternate Modes
126(2)
Vertical Amplifier
128(1)
Vertical Resolution
129(1)
AC and DC Coupling
130(1)
Bandwidth Limit
131(1)
X-Y Display Mode
132(1)
Z-Axis Input
133(1)
High Impedance Inputs
133(1)
50-Ω Inputs
134(1)
Digital Acquisition and Display Techniques
135(6)
Persistence
135(1)
Averaging
136(1)
Peak Detect
137(1)
Roll Mode
138(1)
Dual Timebase
138(1)
Math Functions
139(1)
Cursors
140(1)
Oscilloscope Specifications
141(1)
Scopesmanship
142(1)
Mixed Signal Oscilloscope
143(3)
Oscilloscope Probes
146(5)
1X Probes
146(1)
Loading Effects
147(2)
10X Probes
149(2)
Other Attenuating Probes
151(1)
Probe Compensation
151(1)
Active Probes
152(1)
Differential Measurements
153(1)
Differential Probe
153(1)
High-Voltage Probe
154(1)
Current Probes
155(1)
Probe Specifications
156(1)
References
156(1)
Oscilloscope Measurements
157(58)
Basic Waveform Measurements
157(5)
Sine Wave Measurements
157(2)
Oscilloscopes and Voltmeters
159(1)
Square Wave and Pulse Measurements
160(2)
Voltage Gain Measurement
162(3)
Gain in Decibels
163(1)
AC Voltage Gain
163(2)
Phase Measurement
165(5)
Timebase Method
165(2)
Lissajous Method
167(3)
Frequency Measurement (Lissajous Method)
170(2)
Digital Signal Measurement
172(8)
Pulse Train
173(1)
Pulse Delay
174(1)
Serial Bit Stream
175(1)
Digital Counter
175(3)
D-type Flip-Flop
178(2)
Digital Measurement Hints
180(1)
Frequency Response Measurement
180(4)
Combined Single-Frequency Measurements
180(3)
Swept-Frequency Response
183(1)
Square Wave Test
184(2)
Linearity Measurement
186(3)
Clipping Circuit
187(1)
Amplifier
188(1)
Curve Tracer Measurement Technique
189(2)
Diode I-V Characteristic
191(1)
Resistor I-V Characteristic
192(1)
Amplitude Modulation Measurement
193(1)
Power Measurement
194(3)
FFT Measurements
197(7)
Aliasing
199(1)
Spectral Leakage
200(2)
Harmonic Distortion
202(1)
Amplitude Modulation
203(1)
FFT Summary
204(1)
Basic Time Domain Reflectometry
204(8)
Transmission Line Theory
204(1)
Propagation Velocity
205(1)
Source, Line, and Load
205(1)
Reflection Coefficient
206(2)
Matched Load
208(1)
Open Circuit Load
209(1)
Short Circuit Load
210(1)
Distance down the Transmission Line
211(1)
Other Impedances
211(1)
References
212(3)
Electronic Counters
215(14)
Basic Frequency Counter
215(2)
Frequency Dividers
217(2)
Period Measurement
219(1)
Reciprocal Counter
219(2)
Low Frequency
219(1)
High Frequency
220(1)
Reciprocal Counter
220(1)
Universal Counter
221(2)
Gated Counter Measurements
223(1)
Timebase Accuracy
224(1)
Input Impedance
224(1)
Frequency Counter Specifications
225(1)
Time Interval Analyzer
226(2)
References
228(1)
Power Supplies
229(12)
Power Supplies
229(1)
Circuit Model
230(3)
Constant-Voltage Operation
233(1)
Constant-Current Operation
234(1)
CV-CC Operation
235(1)
Overvoltage/Overcurrent Protection
236(1)
Remote Sensing
236(2)
Measurement Capability
238(1)
Power Supply Specifications
238(2)
References
240(1)
Spectrum and Network Analyzers
241(44)
Spectrum Analyzers
241(1)
Bank-of-Filters Spectrum Analyzer
242(2)
Frequency Resolution
242(2)
FFT Spectrum Analyzers
244(4)
Sampling
244(2)
FFT Computation
246(1)
Specifications
247(1)
Wavemeters
248(3)
The Practical Wavemeter
249(2)
Measurement Example
251(1)
Resolution Bandwidth
251(2)
Narrowband and Broadband Measurements
253(2)
Swept Spectrum Analyzers
255(8)
Sweep Limitations
256(1)
Dynamic Range
257(1)
Effect of Resolution Bandwidth
258(1)
Effect of Video Bandwidth
259(1)
Tracking Generator
260(1)
Spectrum Analyzer Inputs
261(1)
Advanced Features
261(1)
Combined FFT and Swept Analyzer
262(1)
Spectrum Analyzer Measurements
263(4)
Network Analyzers
267(9)
Two-Port Networks
270(1)
S-Parameters
270(2)
Measurement Configurations
272(1)
Network Analyzer Measurements
273(3)
Combination Network/Spectrum Analyzers
276(1)
Distortion Analyzers
276(2)
RF Power Measurements
278(1)
Pulsed RF
278(1)
RF Power Meter
279(3)
Sensors
281(1)
Calibration Factor
281(1)
Zeroing and Calibrating
282(1)
References
282(3)
Logic Analyzers
285(26)
Logic Probes
285(2)
Logic Thresholds
286(1)
Logic Probe Indicators
287(1)
Oscilloscope Logic Measurements
287(1)
Logic Analyzers
288(2)
Timing Analyzer
290(2)
Timing Resolution
290(2)
Glitch Detect
292(1)
Digital Logic Test Example
293(1)
State Analyzer
294(2)
Data Formats
296(1)
State Display
297(1)
Timing Display
298(1)
Microprocessor Measurement
299(2)
Storage Qualification
301(1)
Trigger Events and Sequencing
301(2)
Trigger Events
302(1)
Microprocessor Program Flow
303(2)
Logic Analyzer Probing
305(2)
Logic Thresholds
306(1)
Combined Scope and Logic Analyzer
307(1)
PC-Hosted Logic Analyzer
308(1)
References
309(2)
Circuits for Electronic Measurements
311(32)
Resistance Measurement---Indirect Method
311(2)
Voltage Divider
312(1)
Output Resistance
313(1)
Input Resistance
314(2)
Bridge Measurements
316(2)
The Wheatstone Bridge
316(1)
Impedance Bridges
317(1)
RL and RC Circuits
318(6)
Step Response
318(3)
Frequency Response
321(3)
Resonant Circuits
324(3)
Diode Measurement Circuit
327(1)
Instrument Connections
328(1)
Terminations
328(1)
Attenuators
329(6)
Voltage Divider
330(1)
Z0 Attenuators
331(3)
Impedance-Matching Attenuators
334(1)
Power Splitters and Combiners
335(2)
Measurement Filters
337(4)
High Impedance Filters
338(1)
Z0 Filters
339(2)
References
341(2)
Appendix A: Table of Electrical Parameters, Units, and Standard Abbreviations 343(2)
Appendix B: Mathematical Derivations of Equations 345(10)
B.1 Average (Mean) Value of a Waveform
345(1)
B.2 RMS Value of Waveform
345(2)
B.3 Full-Wave Rectified Average Value of a Waveform
347(1)
B.4 Bandwidth and Rise Time for a Single-Pole System
348(1)
B.5 Frequency Response Due to Coupling Capacitor
349(1)
B.6 Polar and Rectangular Formats
350(1)
B.7 Resonant Frequency
351(4)
Appendix C: Binary, Hexadecimal, Decimal, and ASCII Table 355(6)
Index 361

Excerpts

Preface This book is for the electrical engineer, technician, or student who understands basic electronics and wants to learn more about electronic measurements and test instruments. To use electronic instruments effectively, it is necessary to understand basic measurement theory and how it relates to practical measurements. Basic measurement theory includes such things as how a voltage waveform relates to its frequency and how an instrument can affect the voltage that it is measuring. In an ideal world, we would not have to know anything about the internal operation of an instrument to use it effectively. Although this ideal situation can be approached, it cannot be obtained completely. (One does not have to know how a gasoline engine works to drive an automobile. However, a driver does need to understand the function of the accelerator and brake pedals.) To minimize dealing with the internal workings of an instrument, circuit models and conceptual block diagrams are used extensively. Circuit models take a "black box" approach to describing a circuit. In other words, the behavior of a complex circuit or instrument can be described adequately by conceptually replacing it with a much simpler circuit. This circuit model approach reduces the amount of detail that must be remembered and understood. Conceptual block diagrams show just enough of the inner workings of an instrument so that the reader can understand what the instrument is doing, without worrying about the details of how this is accomplished. In all instrument categories, the traditional analog technologies have been overtaken by digital technology. More precisely, the old analog approach has been replaced by precision analog circuitry that is enhanced by the power of analog-to-digital converters, digital logic, digital signal processing, and measurement algorithms implemented via software. However, a voltage measurement is still a voltage measurement, whether an analog meter or a digital meter is used. Since the measurement is fundamentally the same, this book treats both technologies in a unified manner, emphasizing digital instruments and highlighting the differences between the analog and digital approaches when appropriate. This book does not attempt to be (nor can it be) a substitute for a well-written instrument operating manual. The reader is not well served by a book that says "push this button, turn this knob" because the definition of the buttons and knobs will undoubtedly change with time. Instead, this book is a reference, which provides the reader with a background in electronic instruments. Variations and improvements in instrument design cause each meter, oscilloscope, or function generator to be somewhat unique. However, they all have in common the fundamental measurement principles covered in this book. This second edition of the book includes updates to all of the chapters, incorporating recent developments in technology while still remaining focused on the concepts and principles that last over time. The oscilloscope chapters were expanded, with an increased emphasis on digital oscilloscopes. The section on power supplies was expanded into its own chapter. Chapter 1 covers the basic measurement theory and fundamentals. Chapters 2 through 7 cover the mainstream instruments and applications that the typical user will encounter (meters, signal sources, oscilloscopes, frequency counters, and power supplies). Chapter 8 introduces spectrum analyzer, network analyzers, and RF power meters while Chapter 9 covers logic probes and logic analyzers. Chapter 10 rounds out the book with some important circuit concepts and techniques that enable quality measurements. My original motivation to write this book was my experience in teaching electrical engineering circuit theory courses. Even students with a good background in electrical theory seem to have trouble relating the textbook concepts to what is observed in the laboratory. The concepts of the loading effect, grounding, and bandwidth are particularly troublesome, so they are emphasized throughout the book.

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